Non-ionizing EMF hazard in the 21th century misc.

By: Koh WJ, Moochhala SM

Published in: 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), Suntec City, Singapore. IEEE, 2018: pp. 518-522; ISBN 978-1-5090-3955-5

Book
IEEE Xplore
doi:10.1109/ISEMC.2018.8393832

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Exposure

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