Modeling electromagnetic wave propagation in the UHF range using the MoM to assess NIR exposure level tech./dosim.

By: Guerreiro C, Fraiha S, Fraiha R, Ruiz C, Gomes H, Cavalcante G, Rodrigues J, Araujo J
Published in: 2013 SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference (IMOC), Rio de Janeiro, Brazil. IEEE, 2013: p. 13878032; ISBN 978-1-4799-1397-8
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Exposure