Human EM exposure study for some big scenarios
tech./dosim.
By:
Jeladze V, Tabatadze V, Prishvin M, Petoev I, Bibilashvili L, Tsverava M, Zaridze R
Published in: 2014 IEEE 34th International Scientific Conference on Electronics and Nanotechnology (ELNANO), Kyiv, Ukraine. IEEE, 2014: pp. 342-345; ISBN 978-1-4799-4581-8
