By:
Beard BB, Kainz W, Onishi T, Iyama T, Watanabe S, Fujiwara O, Wang J, Bit-Babik G, Faraone A, Wiart J, Christ A, Kuster N, Lee AK, Kroeze H, Siegbahn M, Keshvari J, Abrishamkar H, Simon W, Manteuffel D, Nikoloski N
Published in: IEEE Trans Electromagn Compat 2006; 48 (2): 397-407