Multi-parameter Hopf-bifurcation in HHM Model Exposed to ELF Electric Field tech./dosim.

By: Jiang W, Yanqiu C, Xiangyang F, Feng D
Published in: 2005 IEEE Engineering in Medicine and Biology 27th Annual Conference, Shanghai. IEEE, 2005: pp. 4646-4649; ISBN 978-0-7803-8741-6
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Exposure