Literature search results

793 articles were found.

The following terms were included: "electromagnetic compatibility", "elektromagnetische Verträglichkeit", EMC, EMV, 電磁両立性

• 1991, Chen JY, Gandhi OP, Conover DL
  SAR and induced current distributions for operator exposure to RF dielectric sealers [tech./dosim.]
  IEEE Trans Electromagn Compat 33 (3): 252-261
• 1990, Hauser JP
  A 20 Hz to 200 kHz magnetic flux probe for EMI surveys [tech./dosim.]
  IEEE Trans Electromagn Compat 32 (1): 67-69
• 1989, Kamimura Y, Tokushige K
  Exposure to the near Field of an RF Plastic Sealer [tech./dosim.]
  8th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Zurich, Switzerland. IEEE: pp. 531-536; ISBN 978-1-5090-3193-1
• 1987, Machczyński W
  Potential Distribution along Earth Return Circuits Exposed to the Induction Field of a Power Line [tech./dosim.]
  7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: pp. 413-416; ISBN 978-1-5090-3192-4
• 1987, Kim HI
  Regulatory and Social Implications of Electromagnetic Compatibility: A Brief Survey of United States Law [basics]
  7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: pp. 239-244; ISBN 978-1-5090-3192-4
• 1987, Bassen H
  New Instrumentation for High-Power Pulsed Microwave Biological Effects Research [basics]
  7th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, Switzerland. IEEE: pp. 233-238; ISBN 978-1-5090-3192-4
• 1987, Hoolihan DD
  A technical analysis of the United States environmental protection agency's proposed alternatives for controlling public exposure to radiofrequency radiation [misc.]
  1987 IEEE International Symposium on Electromagnetic Compatibility, Atlanta, GA, USA. IEEE: pp. 501-504; ISBN 978-1-5090-3174-0
• 1987, Reilly JP, Larkin WD
  Human Sensitivity to Electric Shock Induced by Power-Frequency Electric Fields [basics]
  IEEE Trans Electromagn Compat EMC-29 (3): 221-232
• 1985, Clemmensen JM
  Setting standards for radio-frequency radiation exposure [misc.]
  1985 IEEE International Symposium on Electromagnetic Compatibility, Wakefield, MA, USA. IEEE: pp. 522-524; ISBN 978-1-5090-3172-6
• 1984, Lucas JH, Johnson MJ
  In vitro simulation of the electromagnetic fields near a 3-phase power line [tech./dosim.]
  1984 National Symposium on Electromagnetic Compatibility, San Antonio, TX, San Antonio, Texas. IEEE: pp. 157-160; ISBN 978-1-5090-3170-2
• 1983, Hill DA
  Bandwidth limitations of TEM cells due to resonances [tech./dosim.]
  J Microw Power 18 (2): 181-195
• 1979, Frazier MJ
  The Effect of Electric and Magnetic Fields Near HVDC Converter Terminal on Implanted Cardiac Pacemakers [dev./impl.]
  1979 IEEE International Symposium on Electromagnetic Compatibility, San Diego, CA, USA. IEEE: pp. 385-391; ISBN 978-1-5090-3165-8
• 1979, Tell RA, Mantiply ED
  Recent results on determining population exposure to VHF and UHF broadcast radiation in the United States [tech./dosim.]
  1979 IEEE International Symposium on Electromagnetic Compatibility, San Diego, CA, USA. IEEE: pp. 252-256; ISBN 978-1-5090-3165-8
• 1975, Bronaugh EL, Kerns DR
  Calibration of a multimode microwave exposure chamber [tech./dosim.]
  1975 IEEE International Symposium on Electromagnetic Compatibility, San Antonio, TX, USA. IEEE: 5BIIb1-5BIIb5; ISBN 978-1-5090-3161-0
• 1974, del Blanco JB, Romero-Sierra C, Tanner JA
  Microwave Power Density Measurements in the Presence of Biological Specimens of Size Comparable to the Free Space Wavelength of the Imposed Radiation [tech./dosim.]
  1974 IEEE Electromagnetic Compatibility Symposium Record, San Francisco, CA, USA. IEEE: pp. 1-7; ISBN 978-1-5090-3160-3
• 1973, del Blanco JB, Romero-Sierra C, Tanner JA
  Radiofrequency Fields: A New Ecological Factor [basics]
  1973 IEEE International Electromagnetic Compatibility Symposium Record, New York, NY, USA. IEEE: pp. 1-6; ISBN 978-1-5090-3159-7
• 1971, Osepchuk JM
  Comparison of potential device interference and biological exposure hazards in microwave leakage fields [dev./impl.]
  1971 IEEE International Electromagnetic Compatibility Symposium Record, Philadelphia, PA, USA. IEEE: pp. 155-161; ISBN 978-1-5090-3157-3
• 1970, Inglis LP
  Why the double standard? A critical review of russian work on the hazards of microwave radiation [basics]
  1970 IEEE Electromagnetic Compatibility Symposium Record, Anaheim, CA, USA. IEEE: pp. 168-172; ISBN 978-1-5090-3156-6